Technical Documentation_JXTSEMI

REQUEST QUOTE

0

Technical Documentation

NEWS

Discover the latest breakthroughs, partnerships, and industry insights from JXT.

Home/ News / Technical Documentation

July 17, 2026

Reakthrough 325GHz Millimeter-Wave Characterization: mTRL CPW Wafer-Level Test Solution for Fused Silica
January 4, 2025

325GHz Verification: Fused Silica – The Core Substrate Solution for 6G Millimeter-Wave Chips
January 4, 2025

In-Situ Fabrication of MoS₂/Graphene Heterostructures on Sapphire

Browse By Category

Be the First to Know

top

Stay Up to Date with New Releases

Copyright © Shanghai Kaihui Industrial Equipment Co. LTD All Rights Reserved

paypal

visa

wst

amex

Powered by Bomin