Home/ Products / Silicon Carbide Wafer (SiC Wafer) / 4H-N Type
Specification
Item 4H n-type SiC substrate
Diameter 100±0.3mm
Thickness 350±25μm, 800±25μm
Surface Orientation Off-Axis: 4° toward <11-20>±0.5°
Primary Flat Orientation Parallel to <11-20>±1°
Primary Flat Length 32.5±2.0mm
Secondary Flat Orientation Silicon face up: 90° CW. from Primary flat±5.0°
Secondary Flat Length 18.0±1.5mm
Resistivity 0.014~0.028Ω·cm
Front Surface Finish Si-Face: CMP, Ra<0.5nm
Back Surface Finish C-Face: Optical Polish, Ra<1.0nm
Laser Mark Back side: C-Face
TTV ≤15μm
BOW ≤30μm
WARP ≤40μm
Edge Exclusion ≤3 mm


Customization specifications:
* Various sizes and shapes such as 10*10mm

* Various thicknesses: 0.1~20mm

* Various orientations such as Off-Axis:8°toward <11-20>±0.5°

* Various surface roughness such as slicing,lapping,polishing.

* Silicon carbide crystal ingots are available.


Properties
Crystal Structure Hexagonal
Lattice Constant(nm) α=3.076Å c=10.053Å
Density(g/cm³) 3.21
Melting point(℃) 2830
Mohs Hardness(mohs) 9.2
Dielectric Constant 9.66
Band Gap(eV) 3.26
Breakdown Electrical Field (MV/cm) 3.1
Thermal Conductivity(W/cm·K) 4.5
Thermal Expansion 4.7*10⁻⁶/K
Refractive Index 2.6767 ~ 2.6480
SKU: --
4 inch silicon carbide wafer (4H-N type, double side polished)
Thickness
  • 350μm
  • 800μm
Pieces
  • 1pcs
  • 10pcs
  • 25pcs
Stock: 59999994
Quantity
$175.00 ~ 400.00

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DESCRIPTION
SiC substrate has a large band gap, high breakdown voltage, high electron saturation drift velocity, and high electron mobility, high thermal conductivity, low dielectric constant, strong radiation resistance and good chemical stability and other excellent physical and chemical properties, as well as the characteristics of compatibility with silicon-based device manufacturing processes. JXT is a globally leading silicon carbide wafer supplier, renowned for its premium products and reasonable silicon carbide wafer price.
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