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Specification
1.Epitaxial Parameters




2.Epitaxial Parameters

 
Layer Thickness
AlN 17nm
Buffer ~
Sapphire Substrate 650±25μm

3. Substrate Parameters

Substrate: Patterned Sapphire Substrate(PSS)
Substrate Diameter: 100.0±0.2mm
Substrate Surface: Single side polished


4. Reference:

2"/4"  PSS sapphire substrate is available
RMS(AFM)<1nm
Thickness uniformity < 10%
Single and double side polished PSS sapphires are available.

Epitaxial structure and substrate specifications can be customized, anna@jxtwafer.com,shirley@jxtwafer.com
SKU: --
4 inch AlN on Patterned Sapphire Substrate(PSS)Epitaxial Wafer
Thickness
  • 650μm
Pieces
  • 1pcs
  • 10pcs
Surface
  • SSP
Epitaxial layer thickness
  • 200nm
Stock: 19999998
Quantity
$50.00 ~ 100.00

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DESCRIPTION
4‑inch AlN on Patterned Sapphire Substrate (PSS) Epitaxial Wafer is a high‑quality undoped AlN thin‑film epitaxially grown on micro‑patterned C‑plane sapphire substrate. The periodic micro‑nano patterns effectively suppress threading dislocation propagation, improve crystal quality of subsequent AlGaN/GaN epitaxial layers and greatly boost light‑extraction efficiency for ultraviolet emitters. With wide band‑gap, excellent deep‑ultraviolet transmittance, high thermal conductivity and epi‑ready ultra‑smooth surface, this large‑size template is ideal for mass‑production of high‑performance UVC‑LED, UV laser diodes, ultraviolet detectors, RF‑HEMT and nitride‑based semiconductor research. Custom‑available options include PSS pattern geometry, pattern pitch, AlN film thickness, sapphire substrate thickness and cleaning grade.
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